LandOfFree - US Patents - Listing for Error detection/correction and fault detection/recovery

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Page by page ECC variation in a memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Page by page ECC variation in a memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Paging system having optional forward error correcting code...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Panel driving circuit that generates panel test pattern and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Panel driving circuit that generates panel test pattern and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Parallel arrangement of serial concatenated convolutional...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Parallel backtracing for satisfiability on reconfigurable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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Parallel bit test apparatus and parallel bit test method...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Parallel bit test circuit and method for semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Parallel bit test circuit for testing a semiconductor device in

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Patent

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Parallel bit test circuit in semiconductor memory device and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Parallel bit test circuits for testing semiconductor memory...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Parallel bit testing circuits and methods for integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Parallel burning system and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing

Reexamination Certificate

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Parallel Chien search circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Parallel computer system

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Reexamination Certificate

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Parallel computer system including parallel storage subsystem in

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability

Patent

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Parallel concatenated code with bypass

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Parallel concatenated convolutional coding

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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Parallel concatenated turbo code modulation encoder

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction

Reexamination Certificate

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