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Method of evaluating fault coverage

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method of executing LDPC coding using parity check matrix

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Method of executing test programs for semiconductor testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method of extracting bits from modulated waveforms

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Method of facilitating reliable access of flash memory

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Method of file system recovery logging

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Method of forming a scan path network

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method of forward error correction

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Method of generating a pattern for testing a logic circuit...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method of generating an 8-VSB modulated signal

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Method of generating an interrupt signal when application is...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Method of generating error detection codes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Method of generating parity data based on low-density parity...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Method of generating test clock signal and test clock signal...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method of generating test condition for detecting delay...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method of generating test pattern for integrated circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method of generating test pattern for semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method of generating test patterns for a logic circuit, a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method of generating test patterns to efficiently screen...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method of generating test patterns to efficiently screen...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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