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Method for testing operating system components

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Method for testing operating system components

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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Method for testing path delay faults in sequential logic circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing reflection LCD projector and display...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing reliability of solid-state storage medium

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method for testing semiconductor chips and semiconductor device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing semiconductor chips by means of bit masks

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing semiconductor chips using register sets

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing semiconductor device having embedded nonvolat

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method for testing semiconductor devices having built-in...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
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Method for testing semiconductor integrated circuit and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing semiconductor memory device and test...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method for testing semiconductor memory devices, and apparatus a

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method for testing semiconductor memory modules

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method for testing serializers/de-serializers

Error detection/correction and fault detection/recovery – Pulse or data error handling – Transmission facility testing
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Method for testing signal integrity in a data storage system

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method for testing storage apparatus and system thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method for testing the error ratio BER of a device according...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate
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Method for testing the error ratio of a device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Method for testing the refresh device of an information memory

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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