Method for testing the error ratio BER of a device according...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error count or rate

Reexamination Certificate

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Reexamination Certificate

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07895480

ABSTRACT:
A method for testing the error ratio BER of a device under test against a specified allowable error ratio comprises the steps: measuring ns samples of the output of the device, thereby detecting ne erroneous samples of these ns samples, defining BER(ne)=ne
s as the preliminary error ratio and deciding to pass the device, if the preliminary error ratio BER(ne) is smaller than an early pass limit EPL(ne). The early pass limit is constructed by using an empirically or analytically derived distribution for a specific number of devices each having the specified allowable error ratio by separating a specific portion DD of the best devices from the distribution for a specific number of erroneous samples ne and proceeding further with the remaining part of the distribution for an incremented number of erroneous samples.

REFERENCES:
patent: WO 02/89390 (2002-11-01), None
International Preliminary Report on Patentability.
Search Report.
HFTA-05.0, Statistical Cofindence Levels for Estimating BER Pobability, Maxim Application Notes, Oct. 26, 2000, pp. 1-6.
Dudewicz, et al., Modern Mathematical Statistics, Modern Mathematical Statistics, 1998, pp. 514-526, 520, 526.

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