Method for testing reliability of solid-state storage medium

Details Method for testing reliability of solid-state storage medium Method for testing reliability of solid-state storage medium

2011-08-02

2011-08-02

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S006100, C714S054000, C714S773000, C365S185290, C365S185300, C365S185330

Reexamination Certificate

active

07992061

ABSTRACT:
A method for testing a reliability of a solid-state storage medium is provided, wherein the solid-state storage medium has a plurality of blocks. First, a lifetime of each of the blocks of the solid-state storage medium is obtained. Then, an erase count of each of the blocks is obtained, and whether the erase count is greater than a predetermined erase count is determined. After that, those blocks having their erase counts greater than the predetermined erase count are accumulated to generate a problematic block number, and a test report is output.

REFERENCES:
patent: 5490109 (1996-02-01), Salmon
patent: 6622199 (2003-09-01), Spall et al.
patent: 2008/0046649 (2008-02-01), Ito
patent: 2009/0268521 (2009-10-01), Ueno et al.
patent: 2010/0064096 (2010-03-01), Weingarten et al.
patent: 2010/0115189 (2010-05-01), Lin et al.

Affiliated with

Also associated with

Rating

Method for testing reliability of solid-state storage medium does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for testing reliability of solid-state storage medium, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for testing reliability of solid-state storage medium will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2775859