Circuit for efficiently testing memory and shadow logic of a...
Circuit for evaluating signal timing
Circuit for generating a cyclic code
Circuit for inspecting a data error
Circuit for measuring signal delays of asynchronous inputs...
Circuit for measuring signal delays of asynchronous inputs...
Circuit for modifying stored data
Circuit for monitoring information on an interconnect
Circuit for PLL-based at-speed scan testing
Circuit for PLL-based at-speed scan testing
Circuit for processing trace information
Circuit for reducing test time and semiconductor memory...
Circuit for storing trace information
Circuit for testing power down reset function of an...
Circuit for testing power down reset function of an...
Circuit including a built-in self-test
Circuit scan output arrangement
Circuit state scan-chain, data collection system and...
Circuit structure for testing microprocessors and test...
Circuit test pattern edition apparatus, circuit test pattern...