System for optimizing anti-fuse repair time using fuse ID

System for optimizing anti-fuse repair time using fuse id

System for optimizing the testing and repair time of a defective

System for optimizing the testing and repair time of a...

System for performing automatic test pin assignment for a...

System for performing error correction operations in a...

System for precoding parity bits to meet predetermined...

System for processing and transmitting digital broadcasting...

System for protecting the transmission of live data streams,...

System for protection link supervision

System for reducing test data volume in the testing of logic...

System for remapping defective memory bit sets

System for storing data words in a RAM module

System for storing device test information on a...

System for test data storage reduction

System for testing a group of functionally independent...

System for testing an integrated circuit using multiple test...

System for testing fast synchronous digital circuits,...

System for testing IC chips selectively with stored or...

System for testing multiple devices on a single system and...