System for testing a group of functionally independent...

Details System for testing a group of functionally independent... System for testing a group of functionally independent...

2006-08-01

2006-08-01

Ton, David (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Replacement of memory spare location, portion, or segment

C714S718000, C714S733000

Reexamination Certificate

active

07085972

ABSTRACT:
System for testing a group of functionally independent memories (102) and for replacing failing memory words of the group of functionally independent memories (102) by redundant memory words, comprising: redundancy means108) including at least one array of redundant memory words (108a) and address registers (108b) connected to at least one array of redundant memory words (108a); a test means (114); a group of first multiplexers (110) following the test means (114) and preceding the memories (102) and the at least one array of redundant memory words (108a); and a group of second multiplexers (112) following the memories (102) and the at least one array of redundant memory words (108a), wherein each second multiplexer (112) is connectable to the test means (114).

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patent: 100 02 127 (2001-08-01), None
patent: WO 01/59790 (2001-08-01), None
Schober et al., “Memory Built-In Self-Repair using redundant words,” ITC International Test Conference, IEEE (Germany), p. 995-1001, (2001).

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