Technique for programming clocks in automatic test system
Technique for reducing parity bit-widths for check bit and...
Technique for sharing parity over multiple single-error...
Technique to decrease the exposure time of infrared imaging...
Technique to detect drive strength of input pin
Technique to test an integrated circuit using fewer pins
Techniques for automatic eye-degradation testing of a...
Techniques for capturing signals at output pins in a...
Techniques for capturing signals at output pins in a...
Techniques for decoding information from signals received...
Techniques for detecting and correcting errors in a memory...
Techniques for detecting and correcting errors using...
Techniques for enhanced reliability of data transfer with...
Techniques for entering a low-power link state
Techniques for generating bit reliability information in a...
Techniques for generating bit reliability information in the...
Techniques for generating cyclic redundancy check (CRC) values
Techniques for logic built-in self-test diagnostics of...
Techniques for mitigating, detecting and correcting single...
Techniques for mitigating, detecting, and correcting single...