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Fast sampling test bench

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fast scannable output latch with domino logic input

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fast search-based decoding scheme

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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Fast-scan-flop and integrated circuit device incorporating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault coverage and simplified test pattern generation for...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault detecting method and layout method for semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault detecting method and layout method for semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault detection method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault detection method for electronic circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault detection system with real-time database

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault detector

Error detection/correction and fault detection/recovery – Pulse or data error handling – Error/fault detection technique
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Fault diagnosis apparatus and recording medium with a fault...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault diagnosis method and system for a sequential circuit

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault diagnosis of compressed test responses

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault diagnosis of compressed test responses having one or...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault free store data path for software implementation of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault injection

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault insertion method, boundary scan cells, and integrated...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault insertion using on-card reprogrammable devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Fault isolation through no-overhead link level CRC

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
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