Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2005-03-15
2005-03-15
Tu, Christine T. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S015000, C707S793000
Reexamination Certificate
active
06868512
ABSTRACT:
A method includes receiving incoming fault detection and correction (FDC) data. The incoming FDC data is stored in a real-time database, A first subscriber list designating a first subscriber for at least a portion of the incoming FDC data is provided. The portion of the incoming FDC data designated in the first subscriber list is sent to the first subscriber. A system includes at least one data collection source, a real-time database, and a database management unit. The data collection source is configured to generate incoming fault detection and correction (FDC) data. The database management unit is configured to store the incoming FDC data in the real-time database, provide a first subscriber list designating a first subscriber for at least a portion of the incoming FDC data, and send the portion of the incoming FDC data designated in the first subscriber list to the first subscriber.
REFERENCES:
patent: 5280611 (1994-01-01), Mohan et al.
patent: 6275824 (2001-08-01), O'Flaherty et al.
patent: 6453163 (2002-09-01), Karapetkov et al.
patent: 6668262 (2003-12-01), Cook
Coss, Jr. Elfido
Miller Michael L.
Advanced Micro Devices , Inc.
Tu Christine T.
Williams Morgan & Amerson
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