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Memory unit test

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Memory with integrated programmable controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory with integrated programmable controller

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory with test mode output

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory-embedded LSI

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Memory-module burn-in system with removable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Merged data line test circuit for classifying and testing a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Merged memory and logic (MML) integrated circuits including...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Metadata-facilitated software testing

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and a device for testing electronic memory devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and apparatus for a command based bist for testing...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and apparatus for a low power self test of a memory subsy

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and apparatus for achieving higher performance data compr

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and apparatus for achieving higher product yields by...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and apparatus for at-speed diagnostics of embedded...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and apparatus for automatically identifying multiple...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and apparatus for built-in self-test of smart memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and apparatus for built-in self-test of smart memories

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Method and apparatus for burn-in of semiconductor devices

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Method and apparatus for checking the resistance of...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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