Method and apparatus for at-speed diagnostics of embedded...

Details Method and apparatus for at-speed diagnostics of embedded... Method and apparatus for at-speed diagnostics of embedded...

2007-04-17

2007-04-17

Tu, Christine T. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

Reexamination Certificate

active

10878817

ABSTRACT:
A method of testing an embedded memory which includes providing a programmable memory built-in self-test module and using the programmable memory built-in self-test module to extract contents of the embedded memory upon detection of an error. The programmable memory built-in self-test module includes a pseudo binary search and stop on error function.

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