Memory unit test

Details Memory unit test Memory unit test

2007-10-23

2007-10-23

Lamarre, Guy (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S718000, C714S722000, C365S201000

Reexamination Certificate

active

10494794

ABSTRACT:
The invention relates to a method and device for operating and/or testing memory units, which make it possible to conduct a time-saving test of semiconductor memories during running operation. The inventive method for testing memory units having storage locations provides that, for the storage locations, a first item of test information is formed according to a variable parameter assigned to the respective storage location and according to the contents of the respective storage location.

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