Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2005-06-21
2005-06-21
Tu, Christine T. (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C365S201000, C324S760020, C324S765010
Reexamination Certificate
active
06910162
ABSTRACT:
An environmental tester for memory modules has an environmental chamber for heating the memory modules being tested. One side of the chamber is a backplane. The memory modules are inserted into sockets on module motherboards, which are inserted into motherboard sockets on the backplane. On the other side of the backplane, card sockets receive pattern-generator cards that are outside the environmental chamber but electrically connected to the module motherboards through the backplane. The pattern-generator cards contain pattern-generators that generate address, data, and control signals that exercise the memory modules. The pattern-generator cards can be cooled while the memory modules in the environmental chamber are heated. Pattern-generator cards can be removed for repair and module motherboards can be removed for inserting new memory modules for testing.
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Co Ramon S.
Lai Tat Leung
Sun David Da-Wei
Auvinen Stuart T.
Kingston Technology Corp.
Tu Christine T.
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