Method and a device for testing electronic memory devices

Details Method and a device for testing electronic memory devices Method and a device for testing electronic memory devices

2007-01-23

2007-01-23

Lamarre, Guy J. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S741000, C714S724000

Reexamination Certificate

active

09823926

ABSTRACT:
A method and control device is used for testing electronic memory devices. The method comprises loading test data and/or instructions into a control logic circuit portion associated with a matrix array of memory cells and integrated storage circuitry. According to the invention, a test operation control device is used temporarily instead of the control logic, the test operation control device being external of and connected detachably to the memory device. Advantageously, the test operation control device is a matrix cell array external of the memory.

REFERENCES:
patent: 4450559 (1984-05-01), Bond et al.
patent: 5566386 (1996-10-01), Kumakura et al.
patent: 5732033 (1998-03-01), Mullarkey et al.
Russ et al. ‘Non-intrusive built-in self-test for FPGA and MCM applications;’IEEE; pp. 480-485; Aug. 8-10, 1995.
NN74091034: “Circuit Diagnosis and Design Analysis System; IBM Tech. Discl. Bulletin, Jul. 1987, US, vol. 17 ISSUE: 4 1034-1036 ; Sep. 1, 1974”.
NN74091034: “Circuit Diagnosis and Design Analysis System; IBM Tech. Discl. Bulletin, Jul. 1987, US, vol. 17 Issue: 4; Sep. 1, 1974,” 3 pages.

Affiliated with

Also associated with

Rating

Method and a device for testing electronic memory devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and a device for testing electronic memory devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and a device for testing electronic memory devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3771691