Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2005-02-01
2005-02-01
Decady, Albert (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C315S224000, C361S079000
Reexamination Certificate
active
06851077
ABSTRACT:
A semiconductor component has interface functions between the controller and the power components of power converters, suitable for gating semiconductor switches. In particular, the semiconductor component serves to gate IGBT and MOSFET power switches in low and medium performance three-phase bridge circuits and integrates signal processing (12), level conversion (16) and amplification (gate driver) (17), error recognition, such as short-circuit monitoring by means of VCE detection (19) and operating voltage monitoring (21) as well as error processing (15) for several power semiconductor switches. The advantages of this gating IC in comparison with hybrid or discrete solutions consist of the high integration density of various digital, analogue and driver functions which result in a reduction in the number of discrete components, which means a lower failure rate of the system and lower costs. Another important consideration is the improvement of switching characteristics thanks to monolithic integration. The integrated circuit is less susceptible to interference voltage and has a lower temperature drift than discrete circuits.
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Herzer Reinhard
Lehmann Jan
Massanek Jürgen
Pawel Sascha
Darby & Darby
De'cady Albert
Gandhi Dipakkumar
Semikron Elektronik GmbH
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