Parallel test circuit for semiconductor memory device

Details Parallel test circuit for semiconductor memory device Parallel test circuit for semiconductor memory device

1996-12-20

1999-10-05

Tu, Trinh L.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

714820, 714 42, 365201, 370244, G11C 2900, G06F 1100

Patent

active

059616571

ABSTRACT:
There is disclosed a parallel test circuit for a semiconductor memory device having a memory army with a plurality of memory cells and a plurality of comparators used for high-speed memory cell test, including a plurality of fist comparators performing first comparison with respect to data transmitted through a plurality of data output lines formed near memory blocks of the memory array; a plurality of second comparators coupled in common with each output terminal of the first comparators and performing second comparison with respect to output data of the first comparators; a multiplexer multiplexing output of the second comparator; first and second switches alternatively connected to an output terminal of the multiplexer; and a data output buffer coupled in common with output terminals of the first and second switches and buffering outputs of the first and second switches. The multiplexer is connected to the first switches for a first mode operation, and is connected to the second switch for a second mode operation to thereby perform a two-way data test.

REFERENCES:
patent: 5202888 (1993-04-01), Ochiai
patent: 5428575 (1995-06-01), Fudeyasu
patent: 5436911 (1995-07-01), Mori
patent: 5471480 (1995-11-01), You
patent: 5511029 (1996-04-01), Sawada et al.
patent: 5588115 (1996-12-01), Augarten

Affiliated with

Also associated with

Rating

Parallel test circuit for semiconductor memory device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Parallel test circuit for semiconductor memory device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Parallel test circuit for semiconductor memory device will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1165663