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Self restoring logic

Electronic digital logic circuitry – Reliability – Redundant
Reexamination Certificate

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Semiconductor apparatus having logic level decision circuit...

Electronic digital logic circuitry – Reliability – Redundant
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Semiconductor apparatus having logic level decision circuit...

Electronic digital logic circuitry – Reliability – Redundant
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Semiconductor device capable of reducing noise to signal line

Electronic digital logic circuitry – Reliability – Parasitic prevention in integrated circuit structure
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Semiconductor device having test mode entry circuit

Electronic digital logic circuitry – Reliability – Redundant
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Semiconductor integrated circuit

Electronic digital logic circuitry – Reliability – Redundant
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Semiconductor integrated circuit

Electronic digital logic circuitry – Reliability – Redundant
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Semiconductor integrated circuit

Electronic digital logic circuitry – Reliability
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Semiconductor integrated circuit device and storage...

Electronic digital logic circuitry – Reliability – Redundant
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Semiconductor integrated circuit device of dual configuration ha

Electronic digital logic circuitry – Reliability – Redundant
Patent

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Semiconductor integrated circuit device with a fail-safe IO...

Electronic digital logic circuitry – Reliability – Fail-safe
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Semiconductor integrated circuuit device of dual configuration h

Electronic digital logic circuitry – Reliability – Redundant
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SEU tolerant arbiter

Electronic digital logic circuitry – Reliability
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Simple and high speed BICMOS tristate buffer circuit

Electronic digital logic circuitry – Reliability
Patent

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Single event hardening of null convention logic circuits

Electronic digital logic circuitry – Reliability – Fail-safe
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Single event upset hardened circuitry without sensitivity to...

Electronic digital logic circuitry – Reliability – Fail-safe
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Single event upset immune logic family

Electronic digital logic circuitry – Reliability – Redundant
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Single event upset immune logic family

Electronic digital logic circuitry – Reliability – Redundant
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Single event upset mitigation

Electronic digital logic circuitry – Reliability – Redundant
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Single event upset mitigation

Electronic digital logic circuitry – Reliability – Redundant
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