Electronic digital logic circuitry – Reliability – Redundant
Patent
1993-08-20
1995-07-25
Hudspeth, David R.
Electronic digital logic circuitry
Reliability
Redundant
326125, 327215, H03K 19003
Patent
active
054365724
ABSTRACT:
A semiconductor integrated circuit device has a dual configuration involving a first latch circuit and a second latch circuit that are connected in parallel with each other. The first latch circuit is provided with an input terminal to operate the first latch circuit independently of the second latch circuit. This semiconductor integrated circuit device is capable of individually testing the latch circuits of the dual configuration, to ensure the merit of the dual configuration.
REFERENCES:
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patent: 3917961 (1975-11-01), Reed
patent: 4154395 (1979-05-01), Fancy
patent: 4613777 (1986-09-01), Kible
patent: 4849657 (1989-07-01), Boisvert
patent: 5175605 (1992-12-01), Pavlu et al.
patent: 5250858 (1993-10-01), Strong
Fujitsu Limited
Hudspeth David R.
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