Electronic digital logic circuitry – Reliability – Fail-safe
Reexamination Certificate
2007-07-13
2010-02-02
Tan, Vibol (Department: 2819)
Electronic digital logic circuitry
Reliability
Fail-safe
C326S038000, C327S077000, C327S108000
Reexamination Certificate
active
07656185
ABSTRACT:
A semiconductor IC device includes at least one IO port, a core logic, and at least one fail-safe IO circuit, the fail-safe IO circuit being coupled between the core logic and the IO port, wherein the fail-safe IO circuit is configured to receive a predetermined control signal and to maintain the IO port at a predetermined impedance with respect to the predetermined control signal.
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Kim Dae Gyu
Kim Eon Guk
Kim Ju Young
Lee & Morse P.C.
Samsung Electronics Co,. Ltd.
Tan Vibol
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