Electronic digital logic circuitry – Reliability
Reexamination Certificate
2011-08-16
2011-08-16
Barnie, Rexford N (Department: 2819)
Electronic digital logic circuitry
Reliability
C326S010000, C326S014000
Reexamination Certificate
active
07999567
ABSTRACT:
Single Event Upset (SEU, also referred to as soft error) tolerant arbiters, bare arbiters, and filters are disclosed. An arbiter provides a filter section, and a bare arbiter, coupled to the filter section. The bare arbiter includes a redundant first input and a redundant second input, and a redundant first output and a redundant second output. A pull-down transistor in the bare arbiter conditionally overpowers a corresponding pull-up transistor in the bare arbiter when a contention condition is present in the bare arbiter.
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Jang Wonjin
Martin Alain J.
Moore Christopher D.
Barnie Rexford N
California Institute of Technology
Gates & Cooper LLP
Tran Jany
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