Semiconductor integrated circuit

Electronic digital logic circuitry – Reliability – Redundant

Reexamination Certificate

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Details

C326S009000, C326S012000, C326S013000, C326S040000, C326S113000

Reexamination Certificate

active

07411412

ABSTRACT:
A semiconductor integrated circuit including: N modules set in their functions in accordance with input function setting data, a circuit block having R number of I/O parts, and a module selection part for selecting R number of modules from among the N number of modules connecting the selected R number of modules and R number of I/O parts of the circuit block and connecting one module selected from among at least two modules to each of the R number of I/O parts. Each of the R number of I/O parts has a data holding part for holding a function setting data and inputting the held function setting data to the destination module, and N modules are able to replace functions of each other when the input function setting data are the same.

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patent: 5825197 (1998-10-01), Lane et al.
patent: 6166559 (2000-12-01), McClintock et al.
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patent: 6344755 (2002-02-01), Reddy et al.
patent: 6594183 (2003-07-01), Lofgren et al.
patent: 2004/0075461 (2004-04-01), Nicolaidis
patent: 3192220 (2001-05-01), None
patent: 3491579 (2003-11-01), None

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