LandOfFree - US Patents - Listing for Active solid-state devices (e.g., transistors, solid-state diode,Test or calibration structure

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure for determining how lithographic patterning of a

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure for electrically measuring the degree of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure for improved vertical memory arrays

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure for insulation-film evaluation

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure for locating electromigration voids in dual...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure for measuring effective channel length of a...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure of semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure of semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure responsive to electrical signals for determining

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure responsive to electrical signals for determining

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure to determine the effect of LDD length upon transi

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure to monitor the effects of polysilicon pre-doping

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure used to measure metal bottom coverage in...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structure with TDDB test pattern

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structures and methods for inspection of semiconductor...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structures and models for estimating the yield impact...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structures and models for estimating the yield impact...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structures for development of metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Test structures for development of metal-insulator-metal...