Two-dimensional compton profile imaging method

Details Two-dimensional compton profile imaging method Two-dimensional compton profile imaging method

1987-09-03

1989-07-18

Fields, Carolyn E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 90, 378 6, G01N 23203

Patent

active

048500020

ABSTRACT:
The invention relates to a method of determining the Compton profile of an object to be examined which is situated in an examination zone. The examination zone is irradiated by a monochromatic primary beam whose energy is chosen so that the attenuation of the primary radiation is due essentially only to the Compton Scattering. The scattered radiation is measured in an energy resolving manner and therefrom, as well as from the attenuation in the primary beam, the Compton profiles for the individual pixels in the examination zone are determined.

REFERENCES:
patent: 4375695 (1983-03-01), Harding et al.
patent: 4384209 (1983-05-01), Wagner et al.
R. S. Holt et al., Assessment of Gamma Ray Scattering for the Characterisation of Biological Material, Phys. Med. Biol., 1983, vol. 28, No. 12, pp. 1435-1440.
Samim Anghaie et al., Atomic Composition Measurement in Vivo Using Compton Profile Methods, Trans. Am. Mucl. Soc. 47, 1984, pp. 38-39.

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