X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2006-11-21
2006-11-21
Glick, Edward J. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S086000
Reexamination Certificate
active
07139366
ABSTRACT:
A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Qmin.
REFERENCES:
patent: 4749562 (1988-06-01), Lane et al.
patent: 4751722 (1988-06-01), Harding et al.
patent: 4956856 (1990-09-01), Harding
patent: 5016267 (1991-05-01), Wilkins
patent: 5028352 (1991-07-01), Hietala et al.
patent: 5619548 (1997-04-01), Koppel
patent: 6014423 (2000-01-01), Gutman et al.
patent: 6041099 (2000-03-01), Gutman et al.
patent: 6054712 (2000-04-01), Komardin et al.
patent: 6175117 (2001-01-01), Komardin et al.
patent: 6196715 (2001-03-01), Nambu et al.
patent: 6330301 (2001-12-01), Jiang
patent: 6459761 (2002-10-01), Grodzins et al.
patent: 6483891 (2002-11-01), Lazarev et al.
patent: 2003/0016783 (2003-01-01), Grodzins et al.
patent: 1 477 796 (2004-11-01), None
A Small Angle X-Ray Scattering Study of the Effect of Pressure on the Aggregation of Asphaltene Fractions in Petroleum Fluids under Near-Critical Solvent Conditions, N.F. Carnahan, L. Quintero, D.M. Pfund, J.L. Fulton, R.D. Smith, M. Capel, K. Leontaritis, 1993, American Chemical Society, pp. 2035-2044.
Construction of a Small-Angle X-Ray Scattering Diffractometer for the Study of Fluctuations in Solutions, Hisashi Hayashi, Kelko Nishidawa and Takae Iijima, Japanese Journal of Applied Physics, vol. 28, No. 8, Aug. 1989, pp. 1501-1503.
Two approaches for irradiating cells individually: a charged-particle microbeam and a soft X-ray microprobe; M. Folkard, B. Vojnovic, G. Schettino, M. Forsberg, G. Bowey, K. M. Prise, B.D. Michael, A.G. Michette, S.J. Pfauntsch; Nuclear Instruments and Methods in Physics Research B 130 (1997) pp. 270-274.
Characterization of pore distribution in activated carbon fibers by microbeam small angle X-ray scattering; D. Loznano-Castello, E.Raymund- Pinero, D. Cazorla-Amoros, A.Linares-Solano, M. Muller, C. Riekel, 2002 Elsevier Science Ltd., Carbon 40 (2002) pp. 2727-2735.
Apparatus for simultaneous observation of the electro-optic response and small angle x-ray scattering in liquid crystals; H.F. Gleeson, C. Carboni and A.S. Morse; American Institute of Physics, 1995, pp. 3563-3568.
PIXE setup for liquid sample analysis, J. Kral, J. Voltr, Z. Nejedly; Nuclear Instruments and Methods in Physics Research B 109/110 (1996) pp. 167-169.
Small-Angle X-Ray Scattering Study of Polyelectrolyte Solutions; M. Tomsic, M. Bester Rogac and A. Jamnik; Acta Chism. Slov. 2001, 48, pp. 333-342.
Small Angle X-Ray Scattering; O. Glatter and O. Kratkey; London; New York: Academic Press, 1982, pp. 53-83 and pp. 85-117.
Brinks Hofer Gilson & Lione
Glick Edward J.
Osmic, Inc.
Song Hoon
LandOfFree
Two-dimensional small angle x-ray scattering camera does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Two-dimensional small angle x-ray scattering camera, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Two-dimensional small angle x-ray scattering camera will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3686699