Two-crystal X-ray spectrometer

Details Two-crystal X-ray spectrometer Two-crystal X-ray spectrometer

1984-08-30

1986-04-01

Smith, Alfred E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 85, G01T 136

Patent

active

045802831

ABSTRACT:
A two-crystal X-ray spectrometer in which hinged radius arms carry respective crystals 3, 4, at equal radii, and a spectrometer wavelength adjustment modifies the angular disposition of the source 1 and detector 5 about the corresponding crystals 3, 4, at half the hinge angle rate. Hitherto the crystals were mounted radially.
The improvement consists of displacing the crystals 3, 4, through opposite angles .phi. to the radius line 7', 11', where .phi. lies in the range 50 to 70 degrees. This enables the glancing incidence angle .theta. to be adjusted from 0 to 75 degrees without obstruction of the beam due to the detector 5.
To reduce the detector background due to scattered radiation, screening blades 70, 71, are moved perpendicularly to the center of the respective crystal surface just clear of the spectrometer beam. This enables the arrangement to be more compact than the prior use of Soller slits.

REFERENCES:
patent: 3639759 (1972-02-01), Goshi et al.

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