Reducing leakage current in memory cells

Reducing oxidation stress in the fabrication of devices

Reducing power consumption during MRAM writes using multiple...

Reducing sub-threshold leakage in a memory array

Reducing temporal changes in phase change memories

Reducing the effect of write disturbs in polymer memories

Reduction of drift in phase-change memory via...

Reduction of imprint in ferroelectric devices using a...

Reference cell configuration for a 1T/1C ferroelectric memory

Reference cell configuration for a 1T/1C ferroelectric memory

Reference cell for a 1T/1C ferroelectric memory

Reference cell scheme for MRAM

Reference cell scheme for MRAM

Reference cells for TCCT based memory cells

Reference cells for TCCT based memory cells

Reference cells for TCCT based memory cells

Reference circuit for a non-volatile ferroelectric memory

Reference circuit in ferroelectric memory and method for...

Reference circuit with semiconductor memory array

Reference current distribution in MRAM devices