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Circuit and method for refreshing memory cells of a dynamic...

Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate

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Circuit and method for repairing column in semiconductor...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Circuit and method for replacing a defective memory cell with a

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Circuit and method for retaining data in DRAM in a portable elec

Static information storage and retrieval – Read/write circuit – Data refresh
Patent

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Circuit and method for retaining DRAM content

Static information storage and retrieval – Read/write circuit – Data refresh
Patent

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Circuit and method for selecting reference voltages in...

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate

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Circuit and method for selecting test self-refresh period of...

Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate

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Circuit and method for selecting test self-refresh period of...

Static information storage and retrieval – Read/write circuit – Data refresh
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Circuit and method for selectively overdriving a sense amplifier

Static information storage and retrieval – Read/write circuit – Differential sensing
Patent

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Circuit and method for self-refresh of DRAM cells through...

Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate

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Circuit and method for sensing depletion of memory cells

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Circuit and method for sensing memory cell having multiple thres

Static information storage and retrieval – Read/write circuit – Differential sensing
Patent

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Circuit and method for storing and retrieving data

Static information storage and retrieval – Read/write circuit – Having fuse element
Patent

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Circuit and method for stress testing a static random access...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Circuit and method for terminating a write to a memory cell

Static information storage and retrieval – Read/write circuit
Patent

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Circuit and method for test mode entry of a semiconductor...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Circuit and method for testing a memory device

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Circuit and method for testing a memory device

Static information storage and retrieval – Read/write circuit – Testing
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Circuit and method for testing a memory device

Static information storage and retrieval – Read/write circuit – Testing
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Circuit and method for testing a memory device with a cell plate

Static information storage and retrieval – Read/write circuit – Testing
Patent

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