Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2007-10-24
2009-06-16
Yoha, Connie C (Department: 2827)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S196000
Reexamination Certificate
active
07548478
ABSTRACT:
The present invention provides a self-refresh period adaptable for testing cells that are weak against hot temperature stress. An apparatus for controlling a self-refresh operation in a semiconductor memory device includes a first period selector for generating one of a period-fixed pulse signal having a constant period and a period-variable pulse signal having a variable period based on a temperature of the semiconductor memory device in a test mode; and a self-refresh block for performing the self-refresh operation in response to an output of the first period selector.
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Hynix / Semiconductor Inc.
Mannava & Kang P.C.
Yoha Connie C
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