Circuit and method for selecting test self-refresh period of...

Details Circuit and method for selecting test self-refresh period of... Circuit and method for selecting test self-refresh period of...

2007-11-27

2007-11-27

Yoha, Connie C. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Data refresh

C365S196000

Reexamination Certificate

active

11320650

ABSTRACT:
The present invention provides a self-refresh period adaptable for testing cells that are weak against hot temperature stress. An apparatus for controlling a self-refresh operation in a semiconductor memory device includes a first period selector for generating one of a period-fixed pulse signal having a constant period and a period-variable pulse signal having a variable period based on a temperature of the semiconductor memory device in a test mode; and a self-refresh block for performing the self-refresh operation in response to an output of the first period selector.

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