Circuit and method for testing a memory device with a cell plate

Details Circuit and method for testing a memory device with a cell plate Circuit and method for testing a memory device with a cell plate

1997-05-05

1998-10-13

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

365149, 36518409, G11C 700

Patent

active

058222588

ABSTRACT:
A method for testing a memory device. The method writes test data to an array of cells of the memory device during a test mode. The method calls for driving a cell plate of the memory device during at least a portion of the test with a current level that is less than the current used during normal operation. This amplifies the affect of defective cells on the cell plate voltage thereby allowing identification of unacceptably weak cells with shorter, less strenuous tests.

REFERENCES:
patent: Re35645 (1997-10-01), Tobita
patent: 5337272 (1994-08-01), Suwa et al.
patent: 5640340 (1997-06-01), Fink

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