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Circuit for locking a delay locked loop (DLL) and method...

Static information storage and retrieval – Read/write circuit – Signals
Reexamination Certificate

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Circuit for performing a parallel write test of a wide multiple

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Circuit for programming antifuse bits

Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate

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Circuit for providing a reading phase after power-on-reset

Static information storage and retrieval – Read/write circuit – Including signal comparison
Patent

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Circuit for providing synchronous refresh cycles in self-refresh

Static information storage and retrieval – Read/write circuit – Data refresh
Patent

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Circuit for reading a semiconductor memory

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Circuit for reading bipolar storage cells

Static information storage and retrieval – Read/write circuit – For complementary information
Patent

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Circuit for reading memory elements

Static information storage and retrieval – Read/write circuit
Reexamination Certificate

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Circuit for reducing the loading effect of an insulated-gate fie

Static information storage and retrieval – Read/write circuit – Precharge
Patent

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Circuit for repairing defective bit in semiconductor memory devi

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Circuit for repairing defective bit in semiconductor memory devi

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Circuit for repairing defective bit in semiconductor memory devi

Static information storage and retrieval – Read/write circuit – Bad bit
Patent

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Circuit for resetting a pair of data buses of a...

Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate

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Circuit for resetting a pair of data buses of a...

Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate

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Circuit for sensing back-bias level in a semiconductor memory de

Static information storage and retrieval – Read/write circuit
Patent

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Circuit for sensing memory having a plurality of threshold volta

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Patent

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Circuit for sensing the state of matrix cells in MOS EPROM memor

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Circuit for setting one of a plurality of organization forms...

Static information storage and retrieval – Read/write circuit – Signals
Reexamination Certificate

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Circuit for setting width of input/output data in semiconductor

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Circuit for SRAM test mode isolated bitline modulation

Static information storage and retrieval – Read/write circuit – Testing
Patent

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