Search
Selected: All

Chemical/mechanical polishing slurry, and chemical...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Chemically preventing Cu dendrite formation and growth by...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Chemically removable Cu CMP slurry abrasive

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Utility Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Chemically removable Cu CMP slurry abrasive

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Chuck for supporting wafers with a fluid

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Circumferentially oscillating carousel apparatus for sequentiall

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Circumferentially oscillating carousel apparatus for...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Clean method for recessed conductive barriers

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Cleaning agent for semiconductor parts and method for...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Cleaning brush conditioning apparatus

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Cluster tool method using plasma immersion ion implantation

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

CMP apparatus and method for polishing multiple...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

CMP composition containing organic nitro compounds

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

CMP compositions for low-k dielectric materials

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

CMP in-situ conditioning with pad and retaining ring clean

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

CMP metal polishing slurry and process with reduced solids...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

CMP method for copper, tungsten, titanium, polysilicon, and...

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

CMP method providing reduced thickness variations

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

CMP method utilizing amphiphilic nonionic surfactants

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

CMP methods avoiding edge erosion and related wafer

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.