Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Patent
1998-07-28
2000-11-28
Hitesha, Felisa
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
438690, 438692, 438710, 438712, H01L 21302
Patent
active
061535249
ABSTRACT:
A cluster tool method using plasma immersion ion implantation chamber. In some embodiments, the cluster tool method also includes a controlled cleaving process chamber, as well as others.
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Cheung Nathan
Henley Francois J.
Hitesha Felisa
Perez-Ramos Vanessa
Silicon Genesis Corporation
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