Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;...
Reexamination Certificate
2004-01-23
2010-06-01
Vanore, David A (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
C850S004000, C250S306000, C438S052000, C423S447100
Reexamination Certificate
active
07730547
ABSTRACT:
The present invention is directed toward devices comprising carbon nanotubes that are capable of detecting displacement, impact, stress, and/or strain in materials, methods of making such devices, methods for sensing/detecting/monitoring displacement, impact, stress, and/or strain via carbon nanotubes, and various applications for such methods and devices. The devices and methods of the present invention all rely on mechanically-induced electronic perturbations within the carbon nanotubes to detect and quantify such stress/strain. Such detection and quantification can rely on techniques which include, but are not limited to, electrical conductivity/conductance and/or resistivity/resistance detection/measurements, thermal conductivity detection/measurements, electroluminescence detection/measurements, photoluminescence detection/measurements, and combinations thereof. All such techniques rely on an understanding of how such properties change in response to mechanical stress and/or strain.
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Barrera Enrique V.
Dharap Prasad
Kim Jong Dae
Nagarajaiah Satish
Zhiling Li
Vanore David A
William Marsh Rice University
Winstead PC
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