Scanning probe microscopy cantilever, corresponding...

Details Scanning probe microscopy cantilever, corresponding... Scanning probe microscopy cantilever, corresponding...

2007-08-14

2009-12-22

Vanore, David A (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

General aspects of spm probes, their manufacture, or their...

Probe characteristics

C850S029000, C850S040000, C850S055000, C850S057000, C850S060000, C250S306000, C250S307000

Reexamination Certificate

active

07635392

ABSTRACT:
The present invention provides a scanning probe microscope cantilever comprising a support portion, a lever portion extended from the support portion, and a needle projecting out of a first surface of the cantilever in the vicinity of a free end of the lever portion. From a second surface of the cantilever opposite the first surface, a bore extends through the needle to an aperture formed at a tip of the needle. To the tip of the needle, a substantially globular particle is attached. A method of scanning a sample surface comprises creating relative cantilever motion substantially toward the sample such that the particle experiences a contact force with the sample, illuminating a top surface of the cantilever with laser light such that a portion of the laser light passes through the hollow needle and is emitted from the aperture onto the particle, and detecting scattered light from the sample.

REFERENCES:
patent: 7405089 (2008-07-01), Bloess et al.
patent: 7553335 (2009-06-01), Tanda et al.
patent: 2007/0167814 (2007-07-01), Wakabayashi et al.
patent: 2009/0106869 (2009-04-01), Park et al.
patent: 2005207957 (2005-08-01), None

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