Spin-torque probe microscope

Details Spin-torque probe microscope Spin-torque probe microscope

2008-03-31

2011-11-29

Kim, Robert (Department: 2881)

Scanning-probe techniques or apparatus; applications of scanning

Particular type of scanning probe microscopy or microscope;...

Multiple-type spm, i.e., involving two or more spm techniques

C850S021000, C850S026000, C850S027000, C850S028000, C850S029000

Reexamination Certificate

active

08069492

ABSTRACT:
A spin-torque probe microscope and methods of using the same are described. The spin-torque probe microscope includes a cantilever probe body, a magnetic tip disposed at a distal end of the cantilever probe body, an electrically conductive sample disposed proximate to the magnetic tip, an electrical circuit providing a spin-polarized electron current to the electrically conductive sample, and a vibration detection element configured to sense vibration frequency of the cantilever probe body. The spin-polarized electron current is sufficient to alter a local electron spin or magnetic moment within the electrically conductive sample and be sensed by the magnetic tip.

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