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Cost-effective method to fabricate a combined...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
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Cr-capped chromeless phase lithography

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Critical dimension control of printed features using...

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Critical dimension control using full phase and trim masks

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Cross technology reticles

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Crystallization apparatus, crystallization method, and phase...

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Crystallization apparatus, crystallization method, and phase...

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Crystallization apparatus, crystallization method, thin film...

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Crystallization mask, crystallization method, and method of...

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Damage resistant photomask construction

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Damage-resistant coatings for EUV lithography components

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Damascene extreme ultraviolet lithography (EUVL) photomask...

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Damascene T-gate using a relacs flow

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Dark field trench in an alternating phase shift mask to...

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Dark rims for attenuated phase shift mask

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
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Data processing apparatus, method and program product for...

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Defect correction method for EUV mask

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Defect inspection of extreme ultraviolet lithography masks...

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Defect repair method employing non-defective pattern overlay...

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Defect tolerant transmission lithography mask

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