T-shaped electron-beam microcolumn as a general purpose scanning
Tailoring domain engineered structures in ferroelectric...
Tailoring domain engineered structures in ferroelectric...
Tapered structure suitable for microthermocouples microelectrode
Target changer for an accelerator
Target workpiece inspection apparatus, image alignment...
Technique to quantitatively measure magnetic properties of...
Telegraph signal microscopy device and method
TEM sample equipped with an identifying function, focused...
TEM sample holder
TEM sample preparation from a circuit layer structure
TEM sample preparation from a circuit layer structure
TEM with aberration corrector and phase plate
TEM/SEM sample preparation
Temperature control of a workpiece under ion implantation
Test method of mask for electron-beam exposure and method of...
Testing apparatus using charged particles and device...
Testing apparatus using charged particles and device...
Testing apparatus using charged particles and device...
Testing apparatus using charged particles and device...