Tailoring domain engineered structures in ferroelectric...

Radiant energy – Inspection of solids or liquids by charged particles

Reexamination Certificate

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C250S307000, C359S326000, C359S328000, C365S065000

Reexamination Certificate

active

07151257

ABSTRACT:
Scanning probe apparatus, comprising:a) a tip-electrode which is coupled to be maintained at a first potential;b) a counter-electrode which is positioned in proximity with the tip electrode and which is coupled to be maintained at a second potential differing from the first potential by a value greater than approximately 150 volts; andc) positioning instrumentation, which is adapted to maintain the tip-electrode at a distance from a surface while scanning the tip-electrode parallel to the surface, and controls the position of the tip-electrode in a scanning direction parallel to the surface to within a resolution sufficient so that the apparatus can be used as a scanning probe microscope.

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