Telegraph signal microscopy device and method

Details Telegraph signal microscopy device and method Telegraph signal microscopy device and method

2006-04-12

2008-09-23

Berman, Jack I. (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

C250S307000, C977S876000, C977S875000, C977S860000, C977S849000, C977S840000

Reexamination Certificate

active

07427754

ABSTRACT:
A microscope device includes a probe having a dielectric material with a first side and a second side. First and second electrodes are disposed on the first side of the dielectric material. A nanotube connects the first and second electrodes. A gate electrode is disposed on the second side (e.g., backside) of the dielectric material. The device includes a stage adapted for holding a sample. The stage and probe are moveable with respect to one another such that the sample can be brought in close proximity to the nanotube. The device further includes current measurement circuitry for measuring current (e.g., Random Telegraph Signals) passing through the nanotube. The microscope device is able to identify and characterize single defects on the molecular or atomic scale. The probe device may be combined with spin resonance and/or optical systems such that the detection/mapping/manipulate of single spin and single photon could be achieved.

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