Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Reexamination Certificate
2006-08-08
2006-08-08
Wells, Nikita (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Electron microscope type
C250S310000, C250S306000, C324S662000, C324S067000, C324S765010, C073S105000
Reexamination Certificate
active
07087899
ABSTRACT:
The present invention has the object of providing a charged particle beam irradiation method ideal for reducing the focus offset, magnification fluctuation and measurement length error in charged particle beam devices.To achieve these objects, a method is disclosed in the invention for measuring the electrical potential distribution on the sample with a static electrometer while loaded by a loader mechanism. Another method is disclosed for measuring the local electrical charge at specified points on the sample, and isolating and measuring the wide area electrostatic charge quantity from those local electrostatic charges. Yet another method is disclosed for correcting the measurement length value or magnification based on fluctuations found by measuring the amount of electrostatic charge at the specified points under at least two charged particle optical conditions, and then using a charged particle beam to measure fluctuations in measurement dimensions occurring due to fluctuations in the electrostatic charge at the specified locations.
REFERENCES:
patent: 5512747 (1996-04-01), Maeda
patent: 5723981 (1998-03-01), Hellemans et al.
patent: 5872358 (1999-02-01), Todokoro et al.
patent: 6635873 (2003-10-01), Todokoro et al.
patent: 2003/0071646 (2003-04-01), Neo et al.
patent: 4-181643 (1992-06-01), None
patent: 5-67667 (1993-03-01), None
patent: 5-151927 (1993-06-01), None
patent: 7-176285 (1995-07-01), None
patent: 9-145764 (1997-06-01), None
patent: 9-171791 (1997-06-01), None
patent: 11-126573 (1999-05-01), None
patent: 2000-200579 (2000-07-01), None
patent: 2001-52642 (2001-02-01), None
Asao Kazunari
Ezumi Makoto
Fukaya Ritsuo
Ikegami Akira
Ishijima Tatsuaki
Dickstein , Shapiro, Morin & Oshinsky, LLP
Hashmi Zia R.
Hitachi , Ltd.
Wells Nikita
LandOfFree
Sample electrification measurement method and charged... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Sample electrification measurement method and charged..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sample electrification measurement method and charged... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3704412