Sample carrier for carrying a sample to be irradiated with...

Details Sample carrier for carrying a sample to be irradiated with... Sample carrier for carrying a sample to be irradiated with...

2006-04-25

2006-04-25

Wells, Nikita (Department: 2881)

Radiant energy

Inspection of solids or liquids by charged particles

Analyte supports

C250S311000, C250S442110

Reexamination Certificate

active

07034316

ABSTRACT:
Sample carriers for use in Transmission Electron Microscopes (TEMs) and freely commercially available have the form of a gauze with a strengthening edge. The thickness of these known sample carriers is of the order of magnitude of 20 μm, and is uniform across the entire sample holder. The tiny thickness of these fragile sample carriers makes manipulation difficult. There is a desire to realize automatic introduction and removal of sample carriers in a TEM, seeing as this would make it possible to use the TEM continuously, without human intervention.The invention describes a robust sample carrier whereby—both in the case of manual and automatic manipulation—deformation of and/or damage to the sample carrier is avoided. This is achieved by employing a strengthening edge portion 2 with a thickness 6 larger than the thickness 5 of the middle portion 1 of the sample carrier. The ability to use the sample carrier in analyses in which tilting is important is hereby not impeded.

REFERENCES:
patent: 4242586 (1980-12-01), Warble
patent: 4250127 (1981-02-01), Warren et al.
patent: 6060707 (2000-05-01), Fujihara
patent: 6576910 (2003-06-01), Hashikawa et al.
patent: 2004/0100624 (2004-05-01), Hagiwara et al.
Guide to TEM Grid Selection, SPI Supplies and Structure Probe, Inc., (2000) <http://www.2spi.com/catalog/grids/square—mesh—200.shtml>.

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