Method for correcting astigmatism and focusing in charged partic

Method for correcting distortions in electron backscatter...

Method for detecting an element in a sample

Method for detecting and examining slightly irregular surface st

Method for detecting carrier profile

Method for detecting geometrical-optical aberrations

Method for detecting object picture by electron beam

Method for detecting over-etch defects

Method for determining a profile quality grade of an...

Method for determining depression/protrusion of sample and...

Method for determining depression/protrusion of sample and...

Method for determining intracellular mineral levels

Method for determining opened/unopened semiconductor...

Method for determining pore characteristics in porous materials

Method for determining the aberration coefficients of the...

Method for determining the distance of a near-field probe...

Method for determining the presence of thin insulating films

Method for determining the quality of a lubricant layer on a mag

Method for direct measurement of absorbed dose rate of beta-rays

Method for electron beam-initiated coating for application...