Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type
Reexamination Certificate
2005-03-29
2005-03-29
Lee, John R. (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Electron probe type
C250S397000
Reexamination Certificate
active
06872943
ABSTRACT:
A method for determining a depression/protrusion, especially of a line and space pattern formed on a sample, and an apparatus therefor. A charged particle beam is scanned with its direction being inclined to the original optical axis of the charged particle beam or a sample stage is inclined, broadening of a detected signal in a line scanning direction of the charged particle beam is measured, the broadening is compared with that when the charged particle beam is scanned with its direction being parallel to the original optical axis of the charged particle beam, and a depression/protrusion of the scanned portion is determined on the basis of increase/decrease of the broadening.
REFERENCES:
patent: 4577095 (1986-03-01), Watanabe
patent: 5557105 (1996-09-01), Honjo et al.
patent: 5734164 (1998-03-01), Sanford
patent: 5955739 (1999-09-01), Kawashima
patent: 6570156 (2003-05-01), Tsuneta et al.
patent: 6627887 (2003-09-01), Dudley et al.
patent: 1 045 425 (2000-10-01), None
patent: 1 045 426 (2000-10-01), None
patent: 5-41195 (1993-02-01), None
patent: 5-175496 (1993-07-01), None
Komuro Osamu
Ozawa Yasuhiko
Takane Atsushi
Todokoro Hideo
Yamaguchi Satoru
Dickstein , Shapiro, Morin & Oshinsky, LLP
Gurzo Paul M.
Lee John R.
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