Method for determining depression/protrusion of sample and...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S397000

Reexamination Certificate

active

06872943

ABSTRACT:
A method for determining a depression/protrusion, especially of a line and space pattern formed on a sample, and an apparatus therefor. A charged particle beam is scanned with its direction being inclined to the original optical axis of the charged particle beam or a sample stage is inclined, broadening of a detected signal in a line scanning direction of the charged particle beam is measured, the broadening is compared with that when the charged particle beam is scanned with its direction being parallel to the original optical axis of the charged particle beam, and a depression/protrusion of the scanned portion is determined on the basis of increase/decrease of the broadening.

REFERENCES:
patent: 4577095 (1986-03-01), Watanabe
patent: 5557105 (1996-09-01), Honjo et al.
patent: 5734164 (1998-03-01), Sanford
patent: 5955739 (1999-09-01), Kawashima
patent: 6570156 (2003-05-01), Tsuneta et al.
patent: 6627887 (2003-09-01), Dudley et al.
patent: 1 045 425 (2000-10-01), None
patent: 1 045 426 (2000-10-01), None
patent: 5-41195 (1993-02-01), None
patent: 5-175496 (1993-07-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for determining depression/protrusion of sample and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for determining depression/protrusion of sample and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for determining depression/protrusion of sample and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3433227

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.