Radiant energy – Inspection of solids or liquids by charged particles – Positive ion probe or microscope type
Reexamination Certificate
2005-07-19
2005-07-19
Wells, Nikita (Department: 2881)
Radiant energy
Inspection of solids or liquids by charged particles
Positive ion probe or microscope type
C250S306000, C250S307000
Reexamination Certificate
active
06919563
ABSTRACT:
Disclosed is a defect evaluation apparatus comprising a source section having a source for generating positrons and a moderator for decelerating the positrons, a sample holding section for holding a sample to be measured, a transfer section for transferring the positrons from the source section to the sample holding section, and detection means for detecting γ rays emitted from the sample being measured, characterized in that the apparatus further comprises heating means for heating the moderator in a position where there is a possibility of the source being thermally damaged if there is no protection means mentioned below in the source section, and protection means for protecting the source from the heating means and heated moderator when the moderator is being heated using the heating means.
REFERENCES:
patent: 4740694 (1988-04-01), Nishimura et al.
patent: 4864131 (1989-09-01), Rich et al.
patent: 5063293 (1991-11-01), Rich et al.
patent: 5107221 (1992-04-01), N'Guyen et al.
patent: 5159195 (1992-10-01), Van House
patent: 5200619 (1993-04-01), Asoka kumar et al.
patent: 6630666 (2003-10-01), Greaves
patent: 6635871 (2003-10-01), Xu et al.
patent: 2004/0178353 (2004-09-01), Perez et al.
patent: 03296651 (1991-12-01), None
patent: 04152546 (1992-05-01), None
patent: 07270598 (1995-10-01), None
patent: 2000266699 (2000-09-01), None
“Manufacture of a Colinear Geometry-Type Measurement System for Doppler Broadening Profiles of γ-Rays Emitted from the Annihilation of Positrons,” RADIOISOTOPES, vol. 47, No. 8, p. 623-627 (1998).
Ogura Atsushi
Uedono Akira
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Semiconductor Technology Academic Research Center
Wells Nikita
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