Deconvolving far-field images using scanned probe data

Radiant energy – Inspection of solids or liquids by charged particles – Methods

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07449688

ABSTRACT:
A method for deconvolving far-field optical images beyond the diffraction limit includes the use of near-field optical and other scanned probe imaging data to provide powerful and new constraints for the deconvolution of far-field data sets. Near-field data, such as that which can be obtained from atomic force microscopy on a region of the far-field data set in an integrated and inter-digitate way, is used to produce resolutions beyond the diffraction limit of the lens that is being used. In the case of non-linear optical imaging or other microscopies, resolutions beyond that which is achievable with these microscopies can be obtained.

REFERENCES:
patent: 5155359 (1992-10-01), Monahan
patent: 5298975 (1994-03-01), Khoury et al.
patent: 5453844 (1995-09-01), George et al.
patent: 5724259 (1998-03-01), Seymour et al.
patent: 6166853 (2000-12-01), Sapia et al.
patent: 6212292 (2001-04-01), Soares
patent: 6489611 (2002-12-01), Aumond et al.
patent: 6545273 (2003-04-01), Singh et al.
patent: 6775349 (2004-08-01), Schotland et al.
patent: 6900435 (2005-05-01), Lewis
patent: 2005/0059681 (2005-03-01), Cremer et al.
patent: 2005/0189491 (2005-09-01), Lewis

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Deconvolving far-field images using scanned probe data does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Deconvolving far-field images using scanned probe data, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Deconvolving far-field images using scanned probe data will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4031879

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.