Ion beam milling system and method for electron microscopy...

Ion beam milling system and method for electron microscopy...

Measurement of film thickness of integrated circuits

Measurement technique for determining the width of a...

Method and apparatus for an atmospheric scanning electron micros

Method and apparatus for analyzing components of selected fluid

Method and apparatus for atomic imaging

Method and apparatus for charged particle beam inspection

Method and apparatus for compensating for astigmatism in electro

Method and apparatus for correcting astigmatism in scanning elec

Method and apparatus for detecting positively charged and...

Method and apparatus for determining crystallographic characteri

Method and apparatus for evaluating pattern shape of a...

Method and apparatus for force control of a scanning probe

Method and apparatus for identification of crystallographic defe

Method and apparatus for imaging of an atomic environment

Method and apparatus for measuring dimension of secondary electr

Method and apparatus for neutralizing an accumulated charge on a

Method and apparatus for obtaining two- or three-dimensional inf

Method and apparatus for processing a minute portion of a specim