Radiant energy – Inspection of solids or liquids by charged particles – Methods
Patent
1990-03-09
1993-04-06
Arnold, Bruce Y.
Radiant energy
Inspection of solids or liquids by charged particles
Methods
250306, 359 1, H01J 3726
Patent
active
052006182
ABSTRACT:
A method and apparatus for three dimensional imaging of the atomic environment of disordered adsorbate atoms are disclosed. The method includes detecting and measuring the intensity of a diffuse low energy electron diffraction pattern formed by directing a beam of low energy electrons against the surface of a crystal. Data corresponding to reconstructed amplitudes of a wave form is generated by operating on the intensity data. The data corresponding to the reconstructed amplitudes is capable of being displayed as a three dimensional image of an adsorbate atom. The apparatus includes a source of a beam of low energy electrons and a detector for detecting the intensity distribution of a DLEED pattern formed at the detector when the beam of low energy electrons is directed onto the surface of a crystal. A device responsive to the intensity distribution generates a signal corresponding to the distribution which represents a reconstructed amplitude of a wave form and is capable of being converted into a three dimensional image of the atomic environment of an adsorbate atom on the crystal surface.
REFERENCES:
patent: 4532422 (1985-07-01), Nomura et al.
patent: 4935625 (1990-06-01), Hasegawa et al.
Theeten, J. B. "Analysis of a surface crystallography of a solid: LEED and RHEED techniques" Acta Electronica, vol. 18, No. 1 1975 pp. 39-45.
Saldin, D. K. and de Andres, P. L., "Holographic LEED" Physical Review Letters vol. 64, No. 11 12 Mar. 1990 pp. 1270-1273.
Barton, John J. "Photoelectron Holography" Physical Review Letters vol. 61, No. 12 19 Sep. 1988 pp. 1356-1359.
K. Heinz et al., "Measurement of Diffuse Leed Intensities," Surface Science 173 (1986) pp. 366-378.
J. B. Pendry et al., "SEXAFS Without X-Rays", Surface Science 145 (1984) pp. 33-47, FFT in Two or More Dimensions, Fourier Transform Spectral Methods.
A. Szoke, "X-Ray And Electron Holography Using A Local Referrence Beam," American Institute of Physics (1986).
"Improvement of the Spherical Mirror Analyzer," H. Daimon and S. Ino, Rev. Sci. Instrum. 61 (1), Jan. 1990 pp. 57-60.
Reliability of Diffuse LEED Intensity Measurements, Starke, et al., Surface Science, 216 (1989) pp. 325-342.
"New Display-Type Analyzer for the Energy and the Angular Distribution of Charged Particles", H. Daimon, Rev. Sci. Instrum. 59 (4), Apr. 1988 pp. 545-549.
"SEXAFS Without X-Rays", J. B. Pendry and D. K. Saldin, Surface Science, 145 (1984) pp. 33-47.
de Andres Rodriquez Pedro L.
Saldin Dilano K.
Arnold Bruce Y.
Parsons David R.
University of Wisconsin - Milwaukee
LandOfFree
Method and apparatus for atomic imaging does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for atomic imaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for atomic imaging will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-538594